SIGNAL INTEGRITY SELF-TEST ARCHITECTURE

A method suitable for testing an integrated circuit device is disclosed, the device comprising at least one module (47), wherein the at least one module incorporates at least one associated module monitor (49, 51, 53, 55) suitable for monitoring a device parameter such as temperature, supply noise,...

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Bibliographic Details
Main Author VEENDRICK, HENDRICUS, J., M
Format Patent
LanguageEnglish
French
Published 31.03.2005
Edition7
Subjects
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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Summary:A method suitable for testing an integrated circuit device is disclosed, the device comprising at least one module (47), wherein the at least one module incorporates at least one associated module monitor (49, 51, 53, 55) suitable for monitoring a device parameter such as temperature, supply noise, cross-talk etc. within the module. L'invention porte sur un procédé permettant de tester un dispositif à circuits intégrés. Le dispositif comprend au moins un module qui intègre au moins un dispositif de contrôle de module conçu pour contrôler les paramètres d'un dispositif tels que la température, le bruit d'alimentation, la diaphonie, etc., à l'intérieur du module.
Bibliography:Application Number: WO2004IB50731