METHOD FOR IDENTIFYING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR CHIP

In the manufacturing process of a semiconductor integrated circuit device, a plurality of identification elements having the same arrangement are formed and the relation of magnitude in a physical quantity corresponding to variation in the process of the plurality of identification elements is emplo...

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Bibliographic Details
Main Author MURANAKA, MASAYA
Format Patent
LanguageEnglish
French
Japanese
Published 06.06.2002
Edition7
Subjects
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