CIRCUIT WITH A NON-VOLATILE MEMORY AND METHOD OF ERASING THE MEMORY A NUMBER OF BITS AT A TIME

The threshold of a number of storage transistors is shifted in steps. After such a step, a collective current through the main current channels of a number of these storage transistors is sensed. The same gate-source voltage is applied to all these transistors during sensing. The collective current...

Full description

Saved in:
Bibliographic Details
Main Author CUPPENS, ROGER
Format Patent
LanguageEnglish
French
Published 15.03.2001
Edition7
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The threshold of a number of storage transistors is shifted in steps. After such a step, a collective current through the main current channels of a number of these storage transistors is sensed. The same gate-source voltage is applied to all these transistors during sensing. The collective current indicates whether the threshold of all transistors has been sufficiently shifted. If not, a further threshold shifting step is applied. Le seuil d'un certain nombre de transistors mémoire est décalé par étapes. Après cette étape, le courant collectif circulant à travers les canaux de courant principaux par un certain nombre de ces transistors mémoire est analysé. La même tension grille-source est appliquée à chaque transistor durant l'analyse. Le courant collectif indique si le seuil de chaque transistor a été suffisamment décalé. Si ce n'est pas le cas, une étape supplémentaire de décalage de seuil est appliquée.
Bibliography:Application Number: WO2000EP08444