CIRCUIT WITH A NON-VOLATILE MEMORY AND METHOD OF ERASING THE MEMORY A NUMBER OF BITS AT A TIME
The threshold of a number of storage transistors is shifted in steps. After such a step, a collective current through the main current channels of a number of these storage transistors is sensed. The same gate-source voltage is applied to all these transistors during sensing. The collective current...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | English French |
Published |
15.03.2001
|
Edition | 7 |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The threshold of a number of storage transistors is shifted in steps. After such a step, a collective current through the main current channels of a number of these storage transistors is sensed. The same gate-source voltage is applied to all these transistors during sensing. The collective current indicates whether the threshold of all transistors has been sufficiently shifted. If not, a further threshold shifting step is applied.
Le seuil d'un certain nombre de transistors mémoire est décalé par étapes. Après cette étape, le courant collectif circulant à travers les canaux de courant principaux par un certain nombre de ces transistors mémoire est analysé. La même tension grille-source est appliquée à chaque transistor durant l'analyse. Le courant collectif indique si le seuil de chaque transistor a été suffisamment décalé. Si ce n'est pas le cas, une étape supplémentaire de décalage de seuil est appliquée. |
---|---|
Bibliography: | Application Number: WO2000EP08444 |