SCINTILLATOR PANEL AND RADIATION IMAGE SENSOR

An Ag film (12) is formed as a light-reflecting film on one side of an a-C substrate (10) of a scintillator panel (1). The whole surface of the Ag film (12) is covered with an SiN film (14) for protecting the Ag film (12). A scintillator (16) having a columnar structure for converting the incident r...

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Bibliographic Details
Main Authors HOMME, TAKUYA, TAKABAYASHI, TOSHIO
Format Patent
LanguageEnglish
French
Japanese
Published 26.10.2000
Edition7
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:An Ag film (12) is formed as a light-reflecting film on one side of an a-C substrate (10) of a scintillator panel (1). The whole surface of the Ag film (12) is covered with an SiN film (14) for protecting the Ag film (12). A scintillator (16) having a columnar structure for converting the incident radiation to visible light is provided on the SiN film (14). The scintillator (16) and the substrate (10) are covered with a polyparaxylene film (18). L'invention concerne un film d'argent (12) formé, en tant que film réfléchissant la lumière, sur un côté d'un substrat a-C (10) d'un panneau scintillateur (1). La surface entière du film (12) est recouverte d'un film de SiN (14) destiné à protéger le film d'argent (12). Un scintillateur (16) possédant une structure de type colonne, et destiné à convertir le rayonnement incident en lumière visible, est placé sur le film de SiN (14), le scintillateur (16) et le substrat (10) étant recouverts d'un film de polyparaxylène (18).
Bibliography:Application Number: WO2000JP02422