Slice orientation selection arrangement

A slice orientation selection arrangement for magnetic resonance imaging in planes oblique to the normal cartesian coordinates. The coordinates are rotated to applying gradient signals using Euler computations.

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Bibliographic Details
Main Authors KEREN HANAN, FREUNDLICH DAVID
Format Patent
LanguageEnglish
Published 14.08.2001
Edition7
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A slice orientation selection arrangement for magnetic resonance imaging in planes oblique to the normal cartesian coordinates. The coordinates are rotated to applying gradient signals using Euler computations.
Bibliography:Application Number: US19990234439