Stress-measuring device and method

A stress-measuring device (10) and method determines a level (15) of stress of a user (1), in particular long-term stress. The stress-measuring device (10) includes an input interface (12) for receiving a skin conductance signal (11) indicating the skin conductance of the user (1), the skin conducta...

Full description

Saved in:
Bibliographic Details
Main Authors De Vries, Jan Johannes Gerardus, Ouwerkerk, Martin
Format Patent
LanguageEnglish
Published 08.05.2018
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A stress-measuring device (10) and method determines a level (15) of stress of a user (1), in particular long-term stress. The stress-measuring device (10) includes an input interface (12) for receiving a skin conductance signal (11) indicating the skin conductance of the user (1), the skin conductance signal (11) over time forming skin conductance trace data (13). The stress-measuring device (10) further includes a processing unit (14) for processing the skin conductance trace data (13). The processing unit (14) determines, over at least a portion of the skin conductance trace data (13), values of a rise time (tr) between at least two different points of the skin conductance trace data (13), a frequency distribution of the rise time (tr) values, and the level (15) of stress of the user (1) based on the determined frequency distribution.
Bibliography:Application Number: US201214110454