Method and apparatus to fold optics in tools for measuring shape and/or thickness of a large and thin substrate
A semiconductor measuring tool has a folding mirror configuration that directs a light beam to pass the same space multiple times to reduce the size and footprint. Furthermore, the folding mirrors may reflect the light beam at less than forty-five degrees; thereby allowing for smaller folding mirror...
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Main Authors | , , , , , |
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Format | Patent |
Language | English |
Published |
27.02.2018
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Online Access | Get full text |
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Abstract | A semiconductor measuring tool has a folding mirror configuration that directs a light beam to pass the same space multiple times to reduce the size and footprint. Furthermore, the folding mirrors may reflect the light beam at less than forty-five degrees; thereby allowing for smaller folding mirrors as compared to the prior art. |
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AbstractList | A semiconductor measuring tool has a folding mirror configuration that directs a light beam to pass the same space multiple times to reduce the size and footprint. Furthermore, the folding mirrors may reflect the light beam at less than forty-five degrees; thereby allowing for smaller folding mirrors as compared to the prior art. |
Author | Zhang Yi Wang Chunhai An Zeng Andrew Goodman Frederick Arnold Tang Shouhong Huang Chunsheng |
Author_xml | – fullname: An Zeng Andrew – fullname: Zhang Yi – fullname: Goodman Frederick Arnold – fullname: Wang Chunhai – fullname: Huang Chunsheng – fullname: Tang Shouhong |
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Notes | Application Number: US201615063057 |
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Snippet | A semiconductor measuring tool has a folding mirror configuration that directs a light beam to pass the same space multiple times to reduce the size and... |
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SubjectTerms | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
Title | Method and apparatus to fold optics in tools for measuring shape and/or thickness of a large and thin substrate |
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