Metal line layout based on line shifting
A method of Back-End-Of-Line processing of a semiconductor device is provided including providing a layout for metal lines of a metallization layer of the semiconductor device, determining a semi-isolated metal line in the provided layout and shifting at least a portion of the determined semi-isolat...
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Main Authors | , , , , , |
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Format | Patent |
Language | English |
Published |
20.02.2018
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Subjects | |
Online Access | Get full text |
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Summary: | A method of Back-End-Of-Line processing of a semiconductor device is provided including providing a layout for metal lines of a metallization layer of the semiconductor device, determining a semi-isolated metal line in the provided layout and shifting at least a portion of the determined semi-isolated metal line. |
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Bibliography: | Application Number: US201615045466 |