Method, apparatus, and system for MOL interconnects without titanium liner

Methods, apparatus, and systems for fabricating a semiconductor device comprising a semiconductor substrate; an oxide layer above the semiconductor substrate; a first metal component comprising tungsten disposed within the oxide layer; an interlayer dielectric (ILD) above the oxide layer, wherein th...

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Bibliographic Details
Main Authors Kamineni Vimal, Raymond Mark V, Adusumilli Praneet, Niu Chengyu
Format Patent
LanguageEnglish
Published 13.06.2017
Subjects
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