Field effect transistors including fin structures with different doped regions and semiconductor devices including the same
Field effect transistors are provided. According to the field effect transistor, a source region and a drain region are provided on a substrate and a fin portion is provided to protrude from the substrate. The fin portion connects the source region and the drain region to each other. A gate electrod...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | English |
Published |
16.05.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Field effect transistors are provided. According to the field effect transistor, a source region and a drain region are provided on a substrate and a fin portion is provided to protrude from the substrate. The fin portion connects the source region and the drain region to each other. A gate electrode pattern is disposed on the fin portion and extends to cross over the fin portion. A gate dielectric layer is disposed between the fin portion and the gate electrode pattern. A semiconductor layer is disposed between the fin portion and the gate dielectric layer. The semiconductor layer and the fin portion have dopant-concentrations different from each other, respectively. |
---|---|
Bibliography: | Application Number: US201514980134 |