Field effect transistors including fin structures with different doped regions and semiconductor devices including the same

Field effect transistors are provided. According to the field effect transistor, a source region and a drain region are provided on a substrate and a fin portion is provided to protrude from the substrate. The fin portion connects the source region and the drain region to each other. A gate electrod...

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Bibliographic Details
Main Authors Kim Bomsoo, Oh Changwoo, Kang Myung Gil, Yoon Jongshik
Format Patent
LanguageEnglish
Published 16.05.2017
Subjects
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Summary:Field effect transistors are provided. According to the field effect transistor, a source region and a drain region are provided on a substrate and a fin portion is provided to protrude from the substrate. The fin portion connects the source region and the drain region to each other. A gate electrode pattern is disposed on the fin portion and extends to cross over the fin portion. A gate dielectric layer is disposed between the fin portion and the gate electrode pattern. A semiconductor layer is disposed between the fin portion and the gate dielectric layer. The semiconductor layer and the fin portion have dopant-concentrations different from each other, respectively.
Bibliography:Application Number: US201514980134