Semiconductor devices and semiconductor systems

A semiconductor system and semiconductor device may be provided. The semiconductor system may include a first semiconductor device configured to generate a test mode signal and configured to receive output data. The semiconductor system may include a second semiconductor device configured to enter a...

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Bibliographic Details
Main Authors Baek Young Hyun, Kim Sang Hee, Kim Bo Yeun, Jang Ji Eun
Format Patent
LanguageEnglish
Published 07.03.2017
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Summary:A semiconductor system and semiconductor device may be provided. The semiconductor system may include a first semiconductor device configured to generate a test mode signal and configured to receive output data. The semiconductor system may include a second semiconductor device configured to enter a test mode, based on the test mode signal, and block the output data of data that is stored in redundancy memory cells connected to unrepaired redundancy word lines which are not used among redundancy word lines provided for replacing failed word lines.
Bibliography:Application Number: US201615193588