Vision inspection apparatus and method of compensating gamma defect and mura defect thereof

A vision inspection apparatus includes a first luminance profile generator configured to generate a plurality of first luminance profiles corresponding to the plurality of reference grayscales, a gamma corrector configured to calculate a gamma correction value of the display apparatus using the plur...

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Bibliographic Details
Main Authors Han Jung-Suk, Kim Kang-Hyun, Na Jong-Hee, Moon Hoi-Sik, Chung Jae-Seob, Jung Woo-Jin
Format Patent
LanguageEnglish
Published 21.02.2017
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Summary:A vision inspection apparatus includes a first luminance profile generator configured to generate a plurality of first luminance profiles corresponding to the plurality of reference grayscales, a gamma corrector configured to calculate a gamma correction value of the display apparatus using the plurality of first luminance profiles corresponding to the plurality of reference grayscales, and a second luminance profile generator configured to apply the gamma correction value to each of the plurality of first luminance profiles and to generate a plurality of second luminance profiles corresponding to the plurality of reference grayscales.
Bibliography:Application Number: US201514681015