Vision inspection apparatus and method of compensating gamma defect and mura defect thereof
A vision inspection apparatus includes a first luminance profile generator configured to generate a plurality of first luminance profiles corresponding to the plurality of reference grayscales, a gamma corrector configured to calculate a gamma correction value of the display apparatus using the plur...
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Main Authors | , , , , , |
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Format | Patent |
Language | English |
Published |
21.02.2017
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Subjects | |
Online Access | Get full text |
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Summary: | A vision inspection apparatus includes a first luminance profile generator configured to generate a plurality of first luminance profiles corresponding to the plurality of reference grayscales, a gamma corrector configured to calculate a gamma correction value of the display apparatus using the plurality of first luminance profiles corresponding to the plurality of reference grayscales, and a second luminance profile generator configured to apply the gamma correction value to each of the plurality of first luminance profiles and to generate a plurality of second luminance profiles corresponding to the plurality of reference grayscales. |
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Bibliography: | Application Number: US201514681015 |