Integrated circuit defect detection and repair

In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit m...

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Bibliographic Details
Main Authors Querbach Bruce, Wan Ifar, Schoenborn Theodore Z, Lui William K, Ellis David G, Zhang Yulan, Hampson Christopher W, Zimmerman David J
Format Patent
LanguageEnglish
Published 17.01.2017
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Summary:In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit may be configured to automatically identify defective memory cells in a memory. Upon identifying one or more defective memory cells, the built in self-repair logic circuit may be configured to automatically repair the defective memory cells by replacing defective cells with spare cells within the memory.
Bibliography:Application Number: US201414320164