Method for verifying bad pattern in time series sensing data and apparatus thereof

• Main Authors: Seo Dae Hong, Jung Woo Young, Shin Kae Young, Ahn Dae Jung
• Format: Patent
• Language: English
• Published: 17.01.2017
• Subjects: BASIC ELECTRONIC CIRCUITRY; CALCULATING; CODE CONVERSION IN GENERAL; CODING; COMPUTING; COUNTING; DECODING; ELECTRIC DIGITAL DATA PROCESSING; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method for verifying bad pattern in time series sensing data by calculating a bad pattern error rate, which can be applied to the time series sensing data measured and produced from a predetermined sensor provided in predetermined equipment, and an apparatus thereof are provided. The method includes receiving information on the bad pattern applied to time series sensing data measured by a suspicious sensor, accessing the time series sensing data of each product, generated by the suspicious sensor during a verification period, calculating similarity measures between the bad pattern based on the bad pattern information and the time series sensing data for each product, and calculating an error rate of the bad pattern based on the similarity measures.