Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

• Main Authors: Tanabe Tetsuya, Nakata Hidetaka
• Format: Patent
• Language: English
• Published: 27.12.2016
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

There is provided optical analysis techniques in the scanning molecule counting method using the light measurement with a confocal or multiphoton microscope in which the measuring unit time in the light measurement is set to an appropriate value in order to surely detect an approximately bell shape profile of the signal of a light-emitting particle and avoid excessive increase data volume of time series light intensity data. The inventive optical analysis technique of detecting light of a light-emitting particle in a sample solution generates time series light intensity data of light from a light detection region detected during moving the position of the light detection region of a microscope in the sample solution and detects in the data a signal indicating light from each light-emitting particle individually. The measuring unit time is determined based on the size and the moving speed of the light detection region.