Structured light 3-D measurement module and system for illuminating an area-under-test using a fixed-pattern optic

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Bibliographic Details
Main Authors Bellis Matthew W, Lau Daniel L
Format Patent
LanguageEnglish
Published 29.11.2016
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Bibliography:Application Number: US201113297233