Protocol for assigning features and tuning resolution in digital lithography

A system and method is used to optimize print parameters in the printing of functional electronic materials and integrated objects. The method employs a grid pattern to determine drop spacing and further assigns priority to various features to be printed, separating features into layers to be printe...

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Bibliographic Details
Main Authors Ng Tse Nga, Mei Ping, Ready Steven E
Format Patent
LanguageEnglish
Published 20.09.2016
Subjects
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
COLOUR PRINTING
CORRECTION OF TYPOGRAPHICAL ERRORS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME
LINING MACHINES
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
PERFORMING OPERATIONS
PRINTED CIRCUITS
PRINTING
PRINTING, DUPLICATING, MARKING, OR COPYING PROCESSES
SELECTIVE PRINTING MECHANISMS
STAMPS
TRANSPORTING
TYPEWRITERS
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Summary:A system and method is used to optimize print parameters in the printing of functional electronic materials and integrated objects. The method employs a grid pattern to determine drop spacing and further assigns priority to various features to be printed, separating features into layers to be printed. The most critical layers being printed with higher resolution and greater accuracy, the less critical layers being printed at lower resolution.
Bibliography:Application Number: US201514873568