Reverse performance binning

Various embodiments provide systems, computer program products and computer implemented methods. In some embodiments, the system includes a computer-implemented method of binning at least one integrated circuit chip, the method including determining a baseline operational voltage for the at least on...

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Bibliographic Details
Main Authors KUEMERLE MARK W, ZUCHOWSKI PAUL S
Format Patent
LanguageEnglish
Published 21.06.2016
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Various embodiments provide systems, computer program products and computer implemented methods. In some embodiments, the system includes a computer-implemented method of binning at least one integrated circuit chip, the method including determining a baseline operational voltage for the at least one integrated circuit chip, determining a total operational power threshold for the at least one integrated circuit chip, determining an initial performance characteristic for a first component of the at least one integrated circuit chip, operating the first component at a driving voltage higher than the baseline voltage to raise the initial performance characteristic of the first component to a raised performance characteristic while ensuring that operational power does not exceed the operational power threshold and assigning the at least one integrated circuit chip to a performance bin based on the raised performance characteristic.
Bibliography:Application Number: US201313963438