Cancellation of secondary reverse reflections in a very-fast transmission line pulse system
An approach for cancelling reverse reflections in very-fast transmission line pulse (VFTLP) testing of an electrostatic discharge (ESD) device in a semiconductor is provided. A method includes generating an incident pulse in a VFTLP system for applying to a device under test (DUT). The method also i...
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Format | Patent |
Language | English |
Published |
01.03.2016
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Abstract | An approach for cancelling reverse reflections in very-fast transmission line pulse (VFTLP) testing of an electrostatic discharge (ESD) device in a semiconductor is provided. A method includes generating an incident pulse in a VFTLP system for applying to a device under test (DUT). The method also includes generating a delayed replica of the incident pulse. The method also includes cancelling a portion of a reverse reflection of the incident pulse by combining the delayed replica with the reverse reflection at a power divider. |
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AbstractList | An approach for cancelling reverse reflections in very-fast transmission line pulse (VFTLP) testing of an electrostatic discharge (ESD) device in a semiconductor is provided. A method includes generating an incident pulse in a VFTLP system for applying to a device under test (DUT). The method also includes generating a delayed replica of the incident pulse. The method also includes cancelling a portion of a reverse reflection of the incident pulse by combining the delayed replica with the reverse reflection at a power divider. |
Author | CHANG SHUNHUA T DI SARRO JAMES P GAUTHIER, JR. ROBERT J |
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Snippet | An approach for cancelling reverse reflections in very-fast transmission line pulse (VFTLP) testing of an electrostatic discharge (ESD) device in a... |
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SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
Title | Cancellation of secondary reverse reflections in a very-fast transmission line pulse system |
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