Cancellation of secondary reverse reflections in a very-fast transmission line pulse system

An approach for cancelling reverse reflections in very-fast transmission line pulse (VFTLP) testing of an electrostatic discharge (ESD) device in a semiconductor is provided. A method includes generating an incident pulse in a VFTLP system for applying to a device under test (DUT). The method also i...

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Bibliographic Details
Main Authors GAUTHIER, JR. ROBERT J, CHANG SHUNHUA T, DI SARRO JAMES P
Format Patent
LanguageEnglish
Published 01.03.2016
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An approach for cancelling reverse reflections in very-fast transmission line pulse (VFTLP) testing of an electrostatic discharge (ESD) device in a semiconductor is provided. A method includes generating an incident pulse in a VFTLP system for applying to a device under test (DUT). The method also includes generating a delayed replica of the incident pulse. The method also includes cancelling a portion of a reverse reflection of the incident pulse by combining the delayed replica with the reverse reflection at a power divider.
Bibliography:Application Number: US201213626372