Clamping circuit, a semiconductor apparatus including the same, and a clamping method of the semiconductor apparatus
A semiconductor apparatus that includes: a first high-voltage transistor having a gate and a first electrode, wherein the first electrode is connected to a first pad and a parasitic capacitance forms between the gate and the first electrode; and a clamping circuit that is connected to the gate of th...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
23.02.2016
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor apparatus that includes: a first high-voltage transistor having a gate and a first electrode, wherein the first electrode is connected to a first pad and a parasitic capacitance forms between the gate and the first electrode; and a clamping circuit that is connected to the gate of the first high-voltage transistor, wherein the clamping circuit detects a change in a level of a gate voltage of the first high-voltage transistor due to electrostatic discharge, and clamps the gate voltage of the first high-voltage transistor according to a result of the detection. |
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Bibliography: | Application Number: US201314016644 |