Clamping circuit, a semiconductor apparatus including the same, and a clamping method of the semiconductor apparatus

A semiconductor apparatus that includes: a first high-voltage transistor having a gate and a first electrode, wherein the first electrode is connected to a first pad and a parasitic capacitance forms between the gate and the first electrode; and a clamping circuit that is connected to the gate of th...

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Bibliographic Details
Main Authors KO JAE-HYOK, CHO SANG-YOUNG, KIM WOO-SEOK, KIM HAN-GU
Format Patent
LanguageEnglish
Published 23.02.2016
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Summary:A semiconductor apparatus that includes: a first high-voltage transistor having a gate and a first electrode, wherein the first electrode is connected to a first pad and a parasitic capacitance forms between the gate and the first electrode; and a clamping circuit that is connected to the gate of the first high-voltage transistor, wherein the clamping circuit detects a change in a level of a gate voltage of the first high-voltage transistor due to electrostatic discharge, and clamps the gate voltage of the first high-voltage transistor according to a result of the detection.
Bibliography:Application Number: US201314016644