Method of storing data in nonvolatile memory device and method of testing nonvolatile memory device

A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a conseque...

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Bibliographic Details
Main Authors LEE WONUL, KWONG OH-SUK, YOON MYOUNG-WON, KIM EUN-KYOUNG, LEE JONGUL
Format Patent
LanguageEnglish
Published 10.11.2015
Subjects
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Summary:A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a consequence of determining that the target memory cells are in the program pass state, performing a second verify operation to determine whether the target memory cells exhibit a program error symptom.
Bibliography:Application Number: US201414153140