Extended input/output measurement word facility for obtaining measurement data in an emulated environment

An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O respon...

Full description

Saved in:
Bibliographic Details
Main Authors DYCK GREG A, CARLSON SCOTT M, RIEDY, JR. DALE F, TROTTER JOHN S, WYMAN LESLIE W, LU TAN, ROONEY WILLIAM J, YUDENFRIEND HARRY M, OAKES KENNETH J
Format Patent
LanguageEnglish
Published 05.05.2015
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRIC DIGITAL DATA PROCESSING
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
Online AccessGet full text

Cover

More Information
Summary:An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
Bibliography:Application Number: US201314104577