Methods to perform backscatter inspection of complex targets in confined spaces

Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a s...

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Bibliographic Details
Main Authors SCHUELLER RICHARD L, BAUKUS WILLIAM J, HANDY JOHN P, MCELROY TERRY LEE, WALAZEK DAVID C, SCHUBERT JEFFREY R
Format Patent
LanguageEnglish
Published 30.12.2014
Subjects
BLASTING
DIAGNOSIS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ENGINEERING ELEMENTS AND UNITS
GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVEFUNCTIONING OF MACHINES OR INSTALLATIONS
HEATING
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
LIGHTING
MEASURING
MECHANICAL ENGINEERING
MEDICAL OR VETERINARY SCIENCE
PHYSICS
SAFETY DEVICES IN GENERAL
SURGERY
TESTING
THERMAL INSULATION IN GENERAL
WEAPONS
X-RAY TECHNIQUE
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Summary:Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.
Bibliography:Application Number: US201213446790