Through substrate via semiconductor components and methods of formation thereof

A structure and method of forming through substrate vias in forming semiconductor components are described. In one embodiment, the invention describes a method of forming the through substrate via by filling an opening with a first fill material and depositing a first insulating layer over the first...

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Bibliographic Details
Main Authors BIRNER ALBERT, HOECKELE UWE, KUNSTMANN THOMAS, SEIDEL UWE
Format Patent
LanguageEnglish
Published 26.08.2014
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Summary:A structure and method of forming through substrate vias in forming semiconductor components are described. In one embodiment, the invention describes a method of forming the through substrate via by filling an opening with a first fill material and depositing a first insulating layer over the first fill material, the first insulating layer not being deposited on sidewalls of the fill material in the opening, wherein sidewalls of the first insulating layer form a gap over the opening. The method further includes forming a void by sealing the opening using a second insulating layer.
Bibliography:Application Number: US201313830185