System and method for analyzing an electronics device including a logic analyzer

A system for testing or debugging a system including the integrated circuit having an embedded logic analyzer. In one embodiment, the system includes a computing device coupled to the logic analyzer for receiving the at least one output. A user interface run on the computing device assigns an attrib...

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Bibliographic Details
Main Authors CASE CHRISTOPHER W, MARRA, III MICHAEL ANTHONY, BAILEY JAMES RAY
Format Patent
LanguageEnglish
Published 03.06.2014
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A system for testing or debugging a system including the integrated circuit having an embedded logic analyzer. In one embodiment, the system includes a computing device coupled to the logic analyzer for receiving the at least one output. A user interface run on the computing device assigns an attribute to at least one signal associated with the logic analyzer, determines a new signal or value not provided by the logic analyzer, the new signal or value being based upon the at least one signal as received from the logic analyzer and upon a predetermined definition, and presents the new signal or value to a system user.
Bibliography:Application Number: US20100983016