Object thickness and surface profile measurements

Determining spatial information about a part includes positioning the part in a fixture having two reference surfaces, where the part is positioned between the two reference surfaces, imaging the two reference surfaces and opposing surfaces of the part to different locations of a multi-element detec...

Full description

Saved in:
Bibliographic Details
Main Authors MEIGS ANDREW D, STEELE TYLER, COLONNA DE LEGA XAVIER M, TRUAX BRUCE E, TURNER JUSTIN, MIELKE STEPHEN L
Format Patent
LanguageEnglish
Published 15.04.2014
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
TESTING
Online AccessGet full text

Cover

More Information
Summary:Determining spatial information about a part includes positioning the part in a fixture having two reference surfaces, where the part is positioned between the two reference surfaces, imaging the two reference surfaces and opposing surfaces of the part to different locations of a multi-element detector, simultaneously acquiring images of the opposing sides of the part and the two reference surfaces using the multi-element detector, and determining spatial information about the part based on the simultaneously acquired images.
Bibliography:Application Number: US201113043784