Solid-state image-pickup device, method for driving solid-state image-pickup device, and image-pickup apparatus

A CMOS image sensor in which column-parallel ADCs are mounted. Reference voltages Vref1 to Vref4 having slopes with different gradients and a reference voltage Vref5 are used. Additionally, a comparison circuit that compares an output voltage Vx of a unit pixel with any one of the reference voltages...

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Bibliographic Details
Main Author OIKE YUSUKE
Format Patent
LanguageEnglish
Published 01.04.2014
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Summary:A CMOS image sensor in which column-parallel ADCs are mounted. Reference voltages Vref1 to Vref4 having slopes with different gradients and a reference voltage Vref5 are used. Additionally, a comparison circuit that compares an output voltage Vx of a unit pixel with any one of the reference voltages Vref1 to Vref4, and a comparison circuit that compares the one of the reference voltages Vref1 to Vref4 with the reference voltage Vref5 are included in a column processing circuit. High-resolution AD conversion is performed at a high speed by respective operations of the comparison circuits and an up/down counter.
Bibliography:Application Number: US201113325172