Method and apparatus for reducing read disturb in memory
Various aspects of a NAND memory include have multiple versions of a high threshold voltage distribution-a version with a reduced maximum, and another version. The version with a reduced maximum has a reduced word line pass voltage.
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
03.09.2013
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Subjects | |
Online Access | Get full text |
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Summary: | Various aspects of a NAND memory include have multiple versions of a high threshold voltage distribution-a version with a reduced maximum, and another version. The version with a reduced maximum has a reduced word line pass voltage. |
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Bibliography: | Application Number: US201213406215 |