Apparatus for measurement of surface profile

• Main Authors: CHOI YOUNG-JIN, YOO YOUNG-WOONG, CHO CHEOL-HOON
• Format: Patent
• Language: English
• Published: 16.07.2013
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; PICTORIAL COMMUNICATION, e.g. TELEVISION; TESTING

The present invention relates to an apparatus for measurement of the surface profile detecting 2D-image of the surface of the object. The apparatus for measurement of the surface profile according to the present invention comprises a first light source illuminating a first one-color light to the surface of the object; a second light source illuminating a second one-color light of which color is different from the first one-color light to the surface of the object; a black-and-white camera capturing the first one-color light and the second one-color light reflected from the surface of the object, which are illuminated from the first light source and the second light source; and a controller controlling the first light source, the second light source and the black-and-white camera to obtain a first black-and-white image data and a second black-and-white image data corresponding to the first one-color light and the second one-color light respectively in the state that the first one-color light and the second one-color light are illuminated to the surface of the object, and generating a synthesized color image of the surface of the object using the first black-and-white image data and the second black-and-white image data. Thus, it is possible to obtain the color 2D-image using the low-priced black-and-white camera, and it is also possible to improve processing speed by means of using the black-and-white camera of which processing speed is faster than that of a color camera.