3D x-ray microscopy imaging system

The present disclosure presents, in various aspects and embodiments, a 3D X-ray microscopy imaging technique. Some aspects are directed to various embodiments of an apparatus for use in such a technique, such as an X-ray microscopy imaging system. Other aspects are directed to various embodiments of...

Full description

Saved in:
Bibliographic Details
Main Authors BROWDER MARK K, WOOD J. RICHARD, SHORES WILLIAM B
Format Patent
LanguageEnglish
Published 02.04.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:The present disclosure presents, in various aspects and embodiments, a 3D X-ray microscopy imaging technique. Some aspects are directed to various embodiments of an apparatus for use in such a technique, such as an X-ray microscopy imaging system. Other aspects are directed to various embodiments of a method for use in such a technique, like a method for generating an X-ray image that has a grayscale response proportional to range. Some, though not all, aspects of the technique are computer-implemented, and so include encoded program storage media, programmed computing apparatuses, and computer-implemented methods.
Bibliography:Application Number: US20090604626