Atomic magnetometer and magnetic sensing method

An atomic magnetometer includes a light source for a probe beam and a medium in which the probe beam is to be propagated. The medium is a substance which changes a polarization rotation angle of the probe beam depending on a magnetic field intensity at a first measurement position and a magnetic fie...

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Bibliographic Details
Main Authors SUGIOKA HIDEYUKI, ICHIHARA SUNAO
Format Patent
LanguageEnglish
Published 26.03.2013
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An atomic magnetometer includes a light source for a probe beam and a medium in which the probe beam is to be propagated. The medium is a substance which changes a polarization rotation angle of the probe beam depending on a magnetic field intensity at a first measurement position and a magnetic field intensity at a second measurement position different from the first measurement position. The atomic magnetometer directly measures a difference between the magnetic field intensity at the first measurement position and the magnetic field intensity at the second measurement position as a difference in polarization rotation angle, along a propagation path of the probe beam.
Bibliography:Application Number: US20080740059