Ultrasonic inspection apparatus

• Main Authors: YAMANE NORIYUKI, IKEDA TAKAHIRO, ARAI RYOICHI, ISOBE HIDEO
• Format: Patent
• Language: English
• Published: 12.02.2013
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

There is provided an ultrasonic inspection apparatus using scanning path information with high accuracy at a time of ultrasonic flaw inspection. The ultrasonic inspection apparatus includes: a measurement unit measuring a distance to a surface of the object to be inspected to obtain measurement data including a group of points; a shape data generation unit, by using the measurement data including the group of points obtained by the measurement unit, for generating shape data of the surface of the object to be inspected including the group of points having position information represented by a coordinate system of the scanner mechanism; and a path information generation unit, by using the shape data generated by the shape data generation unit, for calculating a passage point on the surface of the object to be inspected that forms a scanning path of the ultrasonic transducer, and generating the scanning path information of the ultrasonic transducer in which a normal vector of the passage point on the surface of the object to be inspected and an opening surface of the ultrasonic transducer intersect each other, and a distance between the passage point and a center of the opening surface of the ultrasonic transducer is constant.