Semiconductor integrated circuit and electronic device

AVS (Adaptive Voltage Scaling) technique, by which variability and uncertainty are both taken into account. In the system arranged for AVS technique, a detection circuit optimum for each type of process variation is set. Examples of the detection circuit so arranged include a first measurement circu...

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Bibliographic Details
Main Authors KANNO YUSUKE, OTSUGA KAZUO, TAKAZAWA YOSHIO
Format Patent
LanguageEnglish
Published 25.12.2012
Subjects
BASIC ELECTRIC ELEMENTS
CONTROLLING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
REGULATING
SEMICONDUCTOR DEVICES
SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
TESTING
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Summary:AVS (Adaptive Voltage Scaling) technique, by which variability and uncertainty are both taken into account. In the system arranged for AVS technique, a detection circuit optimum for each type of process variation is set. Examples of the detection circuit so arranged include a first measurement circuit for detection of variability, which produces a relative value with respect to the gate delay mean value, and a second measurement circuit for detection of uncertainty, which produces a relative value related to the gate delay standard deviation. The first and second measurement circuits are provided separately from each other. The control information for deciding the supply voltage is prepared based on relative values produced by the detection circuits. When preparing the control information, reference is made to e.g. a table data.
Bibliography:Application Number: US201113012881