Program pattern analyzing apparatus, pattern appearance status information production method, pattern information generating apparatus, and program

Conventionally, there is the problem that a source program that is to be converted cannot be properly analyzed and the conversion ratio cannot be improved. The present invention provides a program pattern analyzing apparatus, comprising: a pattern information storage portion 201 in which at least on...

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Bibliographic Details
Main Author OGAWARA TAKASHI
Format Patent
LanguageEnglish
Published 11.12.2012
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
HANDLING RECORD CARRIERS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
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Summary:Conventionally, there is the problem that a source program that is to be converted cannot be properly analyzed and the conversion ratio cannot be improved. The present invention provides a program pattern analyzing apparatus, comprising: a pattern information storage portion 201 in which at least one piece of first command pattern information of a first source program can be stored; a first source program accepting portion 202 that accepts the first source program; a comparing portion 203 that fetches at least one piece of conversion unit information from the first source program and compares each piece of the fetched conversion unit information with the first command pattern information stored in the pattern information storage portion 201; and a pattern accumulating portion 204 that accumulates comparison command pattern information that is information indicating a command pattern corresponding to the conversion unit information judged by the comparing portion 203 to match none of the first command pattern information, as the first command pattern information, in the pattern information storage portion 201.
Bibliography:Application Number: US20080227773