Metalized elastomeric probe structure

A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer run...

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Bibliographic Details
Main Authors HOUGHAM GARETH GEOFFREY, COTEUS PAUL W, LANZETTA ALPHONSO P, GOMA SHERIF A, MORRIS DANIEL PETER, CORDES STEVEN ALLEN, ROSNER JOANNA, AFZALI ALI, FARINELLI MATTHEW J, YOHANNAN NISHA
Format Patent
LanguageEnglish
Published 08.11.2011
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.
Bibliography:Application Number: US20050718283