End-of-life disabling of a diagnostic test system

Systems and methods for end-of-life disabling of a diagnostic test system are described. In one aspect, a diagnostic test system that includes a test unit and a disabling unit. The test unit performs at least one diagnostic test on a diagnostic assay to determine whether at least one analyte is pres...

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Bibliographic Details
Main Authors PETRUNO PATRICK T, LAPPE MURRAY
Format Patent
LanguageEnglish
Published 20.09.2011
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Systems and methods for end-of-life disabling of a diagnostic test system are described. In one aspect, a diagnostic test system that includes a test unit and a disabling unit. The test unit performs at least one diagnostic test on a diagnostic assay to determine whether at least one analyte is present within a sample. The disabling unit determines a measure of current lifetime of the test unit and disables the test unit in response to a determination that the current lifetime measure meets an end-of-life threshold. In a diagnostic test method, at least one diagnostic test is performed on a diagnostic assay to determine whether at least one analyte is present within a sample. A measure of current lifetime of the test unit is determined. The test unit is disabled in response to a determination that the current lifetime measure meets an end-of-life threshold.
Bibliography:Application Number: US20070625786