Methods and apparatus for testing a component

A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the sur...

Full description

Saved in:
Bibliographic Details
Main Authors MCKNIGHT WILLIAM STEWART, SUH UI WON, ERTEL JOHN WILLIAM, GAMBRELL GIGI OLIVE
Format Patent
LanguageEnglish
Published 06.09.2011
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.
Bibliography:Application Number: US20040993467