Determining a characteristic of atomic particles affecting a programmable logic device

• Main Authors: MATTEIS RAYMOND J, LESEA AUSTIN H, MARGOLESE MICHAEL A, BIALKE NATHAN J
• Format: Patent
• Language: English
• Published: 27.07.2010
• Subjects: BASIC ELECTRONIC CIRCUITRY; ELECTRICITY; MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; PULSE TECHNIQUE; TESTING

Methods and systems are provided for determining a characteristic of an atomic particle affecting a programmable logic device (PLD). The PLD is configured to generate a value at one or more outputs. A source generates a packet of atomic particles. The departure from the source is indicated for the p...