Determining a characteristic of atomic particles affecting a programmable logic device

Methods and systems are provided for determining a characteristic of an atomic particle affecting a programmable logic device (PLD). The PLD is configured to generate a value at one or more outputs. A source generates a packet of atomic particles. The departure from the source is indicated for the p...

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Bibliographic Details
Main Authors MATTEIS RAYMOND J, LESEA AUSTIN H, MARGOLESE MICHAEL A, BIALKE NATHAN J
Format Patent
LanguageEnglish
Published 27.07.2010
Subjects
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
PULSE TECHNIQUE
TESTING
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Summary:Methods and systems are provided for determining a characteristic of an atomic particle affecting a programmable logic device (PLD). The PLD is configured to generate a value at one or more outputs. A source generates a packet of atomic particles. The departure from the source is indicated for the packet of the atomic particles. The PLD is impacted with the packet of the atomic particles. A change is detected in the value of one or more outputs of the PLD. The change in the value of the output or outputs is a result of the impact of the PLD by one of the atomic particles from the packet. A time interval is determined between the departure of the packet of the atomic particles from the source and the change in the value of the output or outputs.
Bibliography:Application Number: US20070975972