Semiconductor device including contact pattern and method for fabricating the same
A method of fabricating a semiconductor device includes forming a barrier film over a semiconductor substrate and over a gate disposed on the substrate; forming a metal layer over the barrier film; selectively etching the metal layer and the barrier film to form a contact pattern between the gates;...
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Main Author | |
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Format | Patent |
Language | English |
Published |
04.05.2010
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Subjects | |
Online Access | Get full text |
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Summary: | A method of fabricating a semiconductor device includes forming a barrier film over a semiconductor substrate and over a gate disposed on the substrate; forming a metal layer over the barrier film; selectively etching the metal layer and the barrier film to form a contact pattern between the gates; forming a spacer over a sidewall of the contact pattern; forming an interlayer insulating film over the contact pattern and the gate; and polishing the interlayer insulating film to expose the contact pattern. |
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Bibliography: | Application Number: US20070967334 |