Multi-layered detector system for high resolution computed tomography

X-ray detector system 18 with improved spatial resolution for a computed tomography systems is provided. Detector system 18 may include pairs of first and second detector arrays 50 and 52, with each array containing detector elements of a different design. In one embodiment, the first array 50 may c...

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Bibliographic Details
Main Author TKACZYK JOHN ERIC
Format Patent
LanguageEnglish
Published 13.04.2010
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:X-ray detector system 18 with improved spatial resolution for a computed tomography systems is provided. Detector system 18 may include pairs of first and second detector arrays 50 and 52, with each array containing detector elements of a different design. In one embodiment, the first array 50 may comprise a first, relatively thin and continuous (i.e., monolithic) scintillation layer 70 with an array of individual diodes 74 positioned to receive light generated within the scintillation layer 70. The second array may comprise a second, relatively thick scintillation layer 80 formed of separate scintillator elements 82. An array of diodes 86 may be positioned to receive radiation from the scintillation layer 80 such that each diode element 82 is aligned to primarily receive radiation from one scintillator element 82 in the layer 80. The structural arrangements of the detector system may also be adapted for applications involving direct conversion of x-ray energy.
Bibliography:Application Number: US20050286122