Semiconductor device and manufacturing method thereof

In manufacturing a semiconductor device, the first gettering layer is formed on the backside of a wafer, and the second gettering layers are then formed on the backside and side surfaces of a chip, allowing these gettering layers to serve as trapping sites against metallic contamination that generat...

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Bibliographic Details
Main Authors KOBAYASHI HIROTAKA, OYU KIYONORI, HAMADA KOJI, OKONOGI KENSUKE
Format Patent
LanguageEnglish
Published 23.02.2010
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