Semiconductor device having strain-inducing substrate and fabrication methods thereof
A semiconductor device includes a semiconductor substrate that includes a substrate layer having a first composition of semiconductor material. A source region, drain region, and a channel region are formed in the substrate, with the drain region spaced apart from the source region and the gate regi...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | English |
Published |
20.10.2009
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A semiconductor device includes a semiconductor substrate that includes a substrate layer having a first composition of semiconductor material. A source region, drain region, and a channel region are formed in the substrate, with the drain region spaced apart from the source region and the gate region abutting the channel region. The channel region includes a channel layer having a second composition of semiconductor material. Additionally, the substrate layer abuts the channel layer and applies a stress to the channel region along a boundary between the substrate layer and the channel layer. |
---|---|
Bibliography: | Application Number: US20080178291 |