Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head

An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative pos...

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Bibliographic Details
Main Authors CHIU MICHAEL A, DIPALO CRAIG A, LEWINNEK DAVID W, MANN SETH E, BOSY BRIAN J
Format Patent
LanguageEnglish
Published 06.10.2009
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional information of the test head in the relation to the peripheral, allowing a controller to issue instructions to the manipulator to correct differences in each of the six degrees of freedom between the mating surfaces of the test head and the manipulator.
Bibliography:Application Number: US20050323557