Reconstruction of a surface topography

A system and method is provided for reconstructing a surface of an object. A system includes an input for receiving a 2-dimensional grid of measurements representing a surface of an object. Each grid point of the 2-dimensional grid of measurements includes information on the slope of the surface in...

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Bibliographic Details
Main Author POTZE WILLEM
Format Patent
LanguageEnglish
Published 11.08.2009
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:A system and method is provided for reconstructing a surface of an object. A system includes an input for receiving a 2-dimensional grid of measurements representing a surface of an object. Each grid point of the 2-dimensional grid of measurements includes information on the slope of the surface in the x-direction and y-direction. A processor selects a 2-dimensional part of the grid and fits a corresponding part of the surface to the measurements of all grid points in the selected part. For each grid point of the selected part, the fitting is based on both the corresponding first and second slope information. An output of the system provides a representation of at least the reconstructed surface part to a user.
Bibliography:Application Number: US20050541983