System and method for advanced logic built-in self test with selection of scan channels

• Main Authors: WANG MICHAEL FAN, RILEY MACK WAYNE
• Format: Patent
• Language: English
• Published: 09.06.2009
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A system and method for advanced logic built-in self test with selection of scan channels is present. An LBIST controller loads scan patterns into a device's scan channels through sequential or interleaved loading techniques in order to minimize instantaneous power requirements. During interlea...