System and method for advanced logic built-in self test with selection of scan channels

• Main Authors: WANG MICHAEL FAN, RILEY MACK WAYNE
• Format: Patent
• Language: English
• Published: 09.06.2009
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A system and method for advanced logic built-in self test with selection of scan channels is present. An LBIST controller loads scan patterns into a device's scan channels through sequential or interleaved loading techniques in order to minimize instantaneous power requirements. During interleave loading, the LBIST controller loads a scan bit into a first scan chain, then into a second scan chain, etc. until one bit is loaded into each scan chain. The LBIST controller then returns to load another scan bit into the first scan channel, then the second scan channel, etc. During sequential loading, the LBIST controller loads an entire scan pattern into a first scan chain (one bit per clock cycle). Once the first scan pattern is loaded, the LBIST controller proceeds to load subsequent scan patterns into corresponding scan chains on a one bit per scan channel per clock cycle basis.