Non-destructive inspection system and associated method

An assembly, system, and method for identifying defects in a structure are provided. The assembly includes a structure of a metallic or composite material, and a flexible sheet of material positioned adjacent to the structure. The assembly also includes a plurality of non-destructive sensors secured...

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Bibliographic Details
Main Authors GEORGESON GARY E, GRIESS KENNETH H
Format Patent
LanguageEnglish
Published 06.05.2008
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An assembly, system, and method for identifying defects in a structure are provided. The assembly includes a structure of a metallic or composite material, and a flexible sheet of material positioned adjacent to the structure. The assembly also includes a plurality of non-destructive sensors secured to the flexible sheet, and a mechanism operable to impact the flexible sheet or proximate to the flexible sheet to generate stress waves within and along a surface of the structure. The system further provides a data acquisition system capable of communicating with the sensors such that the data acquisition system generates feedback indicative of at least a portion of the structure based on data from the stress waves acquired by the sensors.
Bibliography:Application Number: US20050186021