Method, system, and storage medium for estimating and improving test case generation

A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to measure the test coverage can range...

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Bibliographic Details
Main Authors BOHIZIC THEODORE J, DUALE ALI Y, WITTIG DENNIS W
Format Patent
LanguageEnglish
Published 08.04.2008
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to measure the test coverage can range from a few instructions to all the instructions. The technique is easily integrated into existing test generation systems and is applicable to both uni- and multi-processing systems.
Bibliography:Application Number: US20050048965